SRAM Heating Low power Through-silicon vias Cross-section Software Memories Flip-flops Microprocessors Cryptography Single event upset SEU Low-power design Accelerometers Protons Transient faults Diagnostic Analytical models Delay testing Modeling Test Multiple cell upset MCU Monitoring Security Computer architecture Simulation Soft Error Rate Registers Circuit faults Libraries Heavy ions Single Event Upset Silicon Neutron Soft Errors Thermal sensor MRAM Embedded systems Core-cell Fault injection Integrated circuit modeling MEMS Soft errors Hardware Logic gates Ring oscillators Countermeasures Electromagnetic Analysis Reliability Transistors Memory test Fault attacks Integrated circuit interconnections Testability ATPG Clocks Fault tolerance DPA Power demand Hardware Trojan Neutrons SER Crosstalk Design Radiation Testing Calibration Design space exploration VLSI Cross section Logic testing Switches Cryptographie Fiabilité Magnetic tunneling Random access memory Robustness Side-Channel Attacks Accelerometer Atmospheric neutrons Integrated circuit design Sensors BIST Field programmable gate arrays Automatic test pattern generation Memory device AES CMOS integrated circuits Failure analysis SEU DFT Power consumption Delays Variability Integrated circuit testing RSA Education CMOS SoC Fault modeling FPGA