Variability Fault tolerance Analytical models Heavy ions Side Channel Attacks DPA SoC Integrated circuit testing Fault modeling Cryptography Monitoring Soft Errors VLSI AES Single Event Upset DFT Flip-flops Memory test Cross-section Accelerometers Reliability Neutrons Diagnostic Simulation Fault attacks Random access memory Circuit faults Design Sensors Hardware Trojan Atmospheric neutrons Neutron Power demand Low power Thermal sensor Security Core-cell Design space exploration Integrated circuit interconnections Silicon CMOS MEMS FPGA Computer architecture Integrated circuit design Single event upset SEU Transistors Electromagnetic Analysis Delays Magnetic tunneling SER Soft errors Cryptographie Transient faults Calibration Low-power design CMOS integrated circuits Logic gates Heating Integrated circuit modeling ATPG Testing 3D integration Field programmable gate arrays Temperature distribution Robustness Modeling Power consumption Libraries Hardware Accelerometer Switches Memories Microprocessors MRAM Testability Clocks Automatic test pattern generation Protons Spintronics Cross section Countermeasures Soft Error Rate Delay testing Radiation 3D Fiabilité RSA Crosstalk Failure analysis Memory device BIST Test Fault injection Hardware security SEU SRAM Through-silicon vias Embedded systems Logic testing