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Titre du journal ou ISSN
Editeur
Number of Files
494
Nomber of Notices
1 198
Collaborations’ map
Tags
Variability
Fault tolerance
Analytical models
Heavy ions
Side Channel Attacks
DPA
SoC
Integrated circuit testing
Fault modeling
Cryptography
Monitoring
Soft Errors
VLSI
AES
Single Event Upset
DFT
Flip-flops
Memory test
Cross-section
Accelerometers
Reliability
Neutrons
Diagnostic
Simulation
Fault attacks
Random access memory
Circuit faults
Design
Sensors
Hardware Trojan
Atmospheric neutrons
Neutron
Power demand
Low power
Thermal sensor
Security
Core-cell
Design space exploration
Integrated circuit interconnections
Silicon
CMOS
MEMS
FPGA
Computer architecture
Integrated circuit design
Single event upset SEU
Transistors
Electromagnetic Analysis
Delays
Magnetic tunneling
SER
Soft errors
Cryptographie
Transient faults
Calibration
Low-power design
CMOS integrated circuits
Logic gates
Heating
Integrated circuit modeling
ATPG
Testing
3D integration
Field programmable gate arrays
Temperature distribution
Robustness
Modeling
Power consumption
Libraries
Hardware
Accelerometer
Switches
Memories
Microprocessors
MRAM
Testability
Clocks
Automatic test pattern generation
Protons
Spintronics
Cross section
Countermeasures
Soft Error Rate
Delay testing
Radiation
3D
Fiabilité
RSA
Crosstalk
Failure analysis
Memory device
BIST
Test
Fault injection
Hardware security
SEU
SRAM
Through-silicon vias
Embedded systems
Logic testing