A new methodology for EMC prediction of integrated circuits after aging

Chaimae Ghfiri (1, 2) , Alexandre Boyer (1) , Alain Bensoussan (2) , André Durier (2) , Sonia Ben Dhia (1)

1 LAAS-ESE - Équipe Énergie et Systèmes Embarqués
2 IRT Saint Exupéry - Institut de Recherche Technologique

EMC of integrated circuits represents a major constraint for the qualification of electronic circuits. Today, there are existing standardized models such as ICEM-CE that allows the prediction of conducted emission generated by an IC at a PCB level. However, the EMC levels may change after a certain period of operation due to the aging of components. On the other hand, no existing model or tool can predict the long-term EMC levels. This paper presents a new methodology for modeling of integrated circuits in order to construct an EMC model which takes into account the aging based on a new reliability model called M-STORM.

Mots clés: ICEM-CE standard; FPGA; modeling; reliability; aging; Integrated circuits

Domaines: Electronique

Chaimae Ghfiri, Alexandre Boyer, Alain Bensoussan, André Durier, Sonia Ben Dhia. A new methodology for EMC prediction of integrated circuits after aging. IEEE Transactions on Electromagnetic Compatibility, 2019, 61 (2), pp.572-581. ⟨10.1109/TEMC.2018.2819722⟩. ⟨hal-01951615⟩