Epitaxial growth Silica Alloys HfO2 Defects Channeling Al2O3 Low energy electron diffraction LEED NRA Ferromagnetic resonance 13C Gold Silicon Transparent conductive oxide TCO Aluminum Passivation Pb centers Periodic multilayer 8140Ef Atomic Layer Deposition ALD Zinc oxide Ageing RBS 27Ald p&α Energy loss Diffusion Magnetic anisotropy XRD Pulsed laser deposition Raman spectroscopy XPS 17Opp Ion beam analysis Indium oxide Epitaxy PIXE 27Alda AC susceptibility Metal-insulator transition Density functional theory Nanoparticles Annealing Nanostructures AFM X-ray diffraction Topological insulators 2H EPR Ion implantation Acoustic Aluminium 7550Ee Nuclear resonance profiling NRP Thin films Isotopic Tracing 3C-SiC Oxidation 7630Lh 18O Measurement ALD 7550Pp Stable isotopic tracing Magnetic semiconductors Interface defects Rutherford backscattering spectrometry RBS Adsorption Isotherms Capillary condensation NRP 18O resonance 17O 17Op SiC 6855Jk Auger electron spectroscopy AES Silicon Carbide Nitridation 15N Oxygen deficiency Charge exchange Growth Photoluminescence Evaluation 27Aldp Gallium oxide Sputtering Nuclear reaction analysis Acoustic propreties of solid ADSORPTION DESORPTION HYSTERESIS Hysteresis Topological defects Adsorbed layers Adsorption Kossel diffraction Thin film Nickel Magnetization curves Silicon carbide Multilayer GaMnAs